Bipolar Switching Characteristics of RRAM Cells with CaBi₄Ti₄O₁₅ Film

Figure 7

Endurance test of the Al/CBT/ITO/glass cell with different CBT annealing conditions: (a) as-deposited, (b) 450°C annealed, (c) 500°C annealed, and (d) 550°C annealed.

(a)

(b)

(c)

(d)