Research Article
Feasible Time Evolution Model That Predicts Breakdown in Thin SiO2 Films within Unstressed Interval after Constant-Current Stress
Figure 2
Distributions of for various stress conditions. Triangles show the distribution for the conventional CCS without any unstressed interval. Open and closed circles show distributions for the PSMIs with of 6 C/c and of 12 C/c with no unstressed interval, respectively.