Research Article
Feasible Time Evolution Model That Predicts Breakdown in Thin SiO2 Films within Unstressed Interval after Constant-Current Stress
Figure 3
Distributions of for various PSMI conditions. (a) distribution for of 12 C/c. Open circles show the distribution for PSMI without interval. Closed circles show the distribution for multiple PSMI experiments with the interval of a week. (b) distribution for of 6 C/c. Open circles show the distribution for PSMI without interval. Closed circles show the distribution for multiple PSMI experiments with the interval of a week.
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| (b) |