Research Article
Ellipsometric Analysis of Cadmium Telluride Films’ Structure
Figure 3
Range of possible values for the refractive index and index of extinction (a; curves), calculated for CdTe films on CdHgTe; comparison of experimental data with calculated dependence of ellipsometric parameters and on film thickness (b). Numbers near markers specify the film thickness in nm. Numbers 1 and 2 indicate solution number.
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