Ellipsometric Analysis of Cadmium Telluride Films’ Structure

<div>Refractive index <svg height="9.05107pt" id="M88" style="vertical-align:-3.05102pt" version="1.1" viewbox="-0.0498162 -6.00005 11.6618 9.05107" width="11.6618pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M504 89L488 119C453 85 428 69 416 69C408 69 405 75 412 102L462 304C492 438 460 451 436 451S388 441 356 423C311 397 229 336 170 256H168L189 340C208 418 200 451 177 451C144 451 82 413 24 352L40 322C65 345 98 369 108 369C114 369 119 363 112 335L28 -3L36 -12C54 -3 83 4 112 10C125 73 138 122 153 174C205 258 328 382 376 382C395 382 399 369 384 305L330 93C312 25 323 -12 351 -12C378 -12 439 21 504 89Z" id="g50-111"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="512" vert-adv-y="512"></glyph.data></g><g transform="matrix(.0091,0,0,-0.0091,6.591,3.001)"><path d="M389 0V32C297 38 291 46 291 118V635C234 613 175 595 109 583V556L161 554C203 552 207 547 207 497V118C207 46 201 38 110 32V0H389Z" id="g50-50"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="487" vert-adv-y="487"></glyph.data></g></svg> and index of extinction <svg height="9.05107pt" id="M89" style="vertical-align:-3.05102pt" version="1.1" viewbox="-0.0498162 -6.00005 11.4922 9.05107" width="11.4922pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M495 407C495 431 474 451 446 451C409 451 366 416 314 365L162 216L199 373C202 386 204 402 204 414C204 437 197 451 183 451C154 451 87 411 24 352L38 327C72 352 102 370 112 370C117 370 117 358 114 343L35 -5L40 -12C67 -5 93 0 118 2C132 74 144 135 152 157C171 178 196 203 213 216C222 195 264 98 284 59C314 1 328 -12 352 -12C377 -12 416 -6 484 93L465 122C436 85 405 60 393 60C383 60 374 62 354 104L272 276C292 300 375 377 422 377C435 377 449 372 454 367C460 361 466 362 473 367C486 376 495 395 495 407Z" id="g50-232"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="519" vert-adv-y="519"></glyph.data></g><g transform="matrix(.0091,0,0,-0.0091,6.422,3.001)"><path d="M389 0V32C297 38 291 46 291 118V635C234 613 175 595 109 583V556L161 554C203 552 207 547 207 497V118C207 46 201 38 110 32V0H389Z" id="g50-50"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="487" vert-adv-y="487"></glyph.data></g></svg> of outer layer of cadmium telluride films (symbols), grown on silicon (a) and CdHgTe (b) substrates. Curves present optical constants’ change of the mixtures CdTe + oxide (1) and CdTe + air (2). Numbers near markers specify the volume fraction of oxide and air in mixtures.</div>

Advances in Materials Science and Engineering

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Figure 5