Research Article
Modeling of Point Defects Annihilation in Multilayered Cu/Nb Composites under Irradiation
Figure 5
Temporal profiles of occupation probability of (a) vacancy and (b) SIA traps, and average concentrations of (c) vacancies and (d) SIAs in a single layer of copper bounded by two interfaces acting as variable-biased sinks for different values of the surface recombination coefficient, ( K; m; m−3 s−1).
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