Analytical Formulation for Electromagnetic Leakage Field to Transmission Line Coupling through Covered Apertures of Multiple Enclosures

<div>Electric current induced at termination load <svg height="12.1436pt" id="M140" style="vertical-align:-3.18148pt" version="1.1" viewbox="-0.0498162 -8.96212 14.0106 12.1436" width="14.0106pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M669 636L663 650H260C230 650 221 652 208 675H186C177 621 162 548 144 481L173 479C195 534 211 560 226 578C248 604 266 615 373 615H544C460 511 114 112 23 16L31 0H561C577 34 611 135 622 170L594 182C566 125 544 88 515 65C481 38 416 35 319 35C249 35 197 37 152 41C270 184 542 501 669 636Z" id="g113-91"></path><glyph.data ascent="3473" descent="-2876" horiz-adv-x="692" vert-adv-y="692"></glyph.data></g><g transform="matrix(.0091,0,0,-0.0091,8.931,3.132)"><path d="M414 144C384 79 371 75 317 75H135L276 221C367 316 408 376 408 465C408 570 327 635 237 635C179 635 131 609 100 575L42 494L67 471C94 510 138 565 205 565C277 565 321 517 321 435C321 348 258 270 195 195C146 137 88 81 33 26V0H411C423 44 433 88 446 135L414 144Z" id="g50-51"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="487" vert-adv-y="487"></glyph.data></g></svg> for a covered circular aperture from the analytical model and the CST.</div>

Advances in Materials Science and Engineering

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Figure 6

Figure 6: Analytical Formulation for Electromagnetic Leakage Field to Transmission Line Coupling through Covered Apertures of Multiple Enclosures 