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Thin Film Applications in Advanced Electron Devices

Call for Papers

The theme of this special issue is focused on thin film applications in advanced electron devices. The field of thin films, which can be defined as the confluence of materials science, surface science, chemistry, and applied physics, has become an identifiable unified discipline of scientific endeavor.

Authors are invited to submit original research articles as well as review articles to this special issue. Potential topics include, but are not limited to:

  • Fundamentals of thin films and devices:
    • Nanomaterials and nanostructured thin films
    • Electronic structures and defects
    • Thermal and mechanical properties
    • Advanced synthesis and growth techniques
    • Advanced fabrication technologies
    • Thin film characterization and reliability
    • Device characterization techniques
    • Device reliability
    • Modeling and simulation: device or process materials science and device physics
  • Thin film applications in:
    • Novel functional devices
    • Nonvolatile memories
    • Optoelectronic devices
    • Advanced transistors
    • Sensors and actuators
    • Biology and medicine
    • Organic materials-based devices
    • Magnetics and magnetooptics
    • Superconductors

Before submission authors should carefully read over the journal’s Author Guidelines, which are located at http://www.hindawi.com/journals/amse/guidelines/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/submit/journals/amse/tfa/ according to the following timetable:

Manuscript DueFriday, 4 October 2013
First Round of ReviewsFriday, 27 December 2013
Publication DateFriday, 21 February 2014

Lead Guest Editor

  • Fu-Chien Chiu, Department of Electronic Engineering, Ming Chuan University, Taoyuan, Taiwan

Guest Editors

  • Tung-Ming Pan, Department of Electronic Engineering, Chang Gung University, Taoyuan, Taiwan
  • Tapas Kumar Kundu, Department of Physics, Visva-Bharati University, West Bengal, Santiniketan 731235, India
  • Chun-Hsing Shih, Department of Electrical Engineering, National Chi Nan University, Nantou, Taiwan