Microcavity Silicon Photodetectors at 1.55 μm

Table 3

Optical and electrical properties for silicon and copper used in our simulations.

	Complex refractive index at 1550 nm	Thickness [μm]	Mean free path (Le) [μm]	Fermi level (EF) [eV]	Potential barrier (Φ𝐵) [eV]
Copper (Cu)	0.145-j9.830	0.20	0.045	7.050	0.720
Silicon	3.48	100	—	—	—