Table 3: Optical and electrical properties for silicon and copper used in our simulations.

Complex refractive index at 1550 nmThickness [μm]Mean free path (Le) [μm]Fermi level (EF) [eV]Potential barrier ( Φ 𝐵 ) [eV]

Copper (Cu)0.145-j9.8300.200.0457.0500.720
Silicon3.48100