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Advances in OptoElectronics
Volume 2012 (2012), Article ID 347875, 5 pages
Conditions of Perfect Imaging in Negative Refraction Materials with Gain
1State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510275, China
2Department of Physical Electronics, School of Electrical Engineering, Faculty of Engineering, Tel Aviv University, 69978 Tel Aviv, Israel
3Chemical Physics Department, Weizmann Institute of Science, 76100 Rehovot, Israel
Received 29 June 2012; Accepted 3 October 2012
Academic Editor: Alexandra E. Boltasseva
Copyright © 2012 Haowen Liang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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