Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Table 1

Sub-linear model fitting extrapolation of burn-in curves for cases A and B.

	Case A	Case B
Fitting exponent	𝑚=0.2	𝑚=0.4
Fitting-correlation factor	𝑓=0.961	𝑓=0.865
𝐼th stabilization	At 12 hr	At 24 hr
𝑅 square	0.967	0.874
Sample size	4	5