Three-Dimensional Silicon-Germanium Nanostructures for CMOS Compatible Light Emitters and Optical Interconnects
Figure 4
The PL intensity
as a function of excitation intensity in MBE grown Si/Si1-xGex 3D NS samples with the indicated average Ge concentration x. The PL bands
associated with the cluster core, wetting layer (WL), and characteristic TO
phonons are indicated.