Research Article

Development of Silicon Photonics Devices Using Microelectronic Tools for the Integration on Top of a CMOS Wafer

Table 1

State of the art of silicon-based optical modulators.

Modulator typeλ ( ) Bandwidth or Extinction Insertion Labs
( )time constantratio (dB)loss (dB)

Franz Keldysh effect   in Ge diode1.647no7.52.5S. Jongthammanurak,
Group IV photonics,
ottawa (2006)

Quantum confined Stark 1.55 at noAbsorption coefficient contrast >3Kuo and al, IEEE
effect (QCSE) in Ge/SiGe JSTQE, 12 (6)
quantum wells p1503 (2006)

Carrier injection 1.5512.5 Gbit/s>9Q. Xu et al., Optics express,
in lateral PIN diode15 (2) p 430 (2007)

MOS capacitance 1.55 7.71 GHzA. Liu et al., nature
427, 615–618 (2004)
3.310 Gbit/s3.810L. Liao et al.,
optics express 13,
3129–3135 (2005)

Carrier depletion 1.55430 GHz (40 Gbit/s)7Liu and al optics express,
(vertical PN diode)15 (2) p660, (2007)

Carrier depletion 1.31 1.553.1 (exp)Time constant D. Marris-Morini et al.,
(Doped modulation of ~ 1ps optics express, 14
vertical Si PIN diode)(Theory)(22) 10838 (2006)

Carrier depletion 1.55510 GHz5This work
(Doped modulation of
all Si lateral PIN diode)

Carrier depletion 1.5539 GHz63T. Pinguet
(Doped modulation of Group IV photonics
all Si lateral PN diode) Tokyo 2007

Carrier depletion 1.552.5 (theory) Time constant 2F. Y. Gardes et al.,
(four terminal p+pnn+birefringence<7 ps optics express 13 (22),
vertical device) free(Theory)8845–8854, (2005)