Editorial Board

Mustafa A. G. Abushagur, Rochester Institute of Technology, USA
Partha P. Banerjee, University of Dayton, USA
Ralph Barry Johnson, Alabama A&M University , USA
Augusto Belendez, Universidad de Alicante, Spain
Steve Blair, University of Utah, USA
Maria Luisa Calvo, Complutense University of Madrid, Spain
H. John Caulfield, Fisk University and Alabama A&M University Research Institute, USA
Pierre Chavel, Institut d Optique, Universite Paris-Sud and CNRS, France
Zhongping Chen, University of California, USA
Fu-Pen Chiang, Stony Brook University, USA
Petr Eliseev, The University of New Mexico, USA
Michael A. Fiddy, University of North Carolina, USA
Patti Gillespie, Army Research Laboratory, USA
Richard B. Hoover, NASA, USA
Zoran Ikonic, The University of Leeds, United Kingdom
Saulius Juodkazis, Centre for Micro-Photonics, Australia
Mark A. Kahan, Optical Research Associates, USA
Alexander A. Kaminskii, Russian Academy of Science, Russia
Qiang Lin, Zhejiang University, China
Liren Liu, Chinese Academy of Sciences, China
Qingming Luo, Huazhong University of Science and Technology, China
Daniel Malacara, CIO.Centro de Investigaciones en Óptica, Mexico
Mikhail Noginov, Norfolk State University, USA
Ci-Ling Pan, National Tsing Hua University, Taiwan
Markus Pessa, Tampere University of Technology, Finland
Giancarlo C. Righini, National Research Council, Italy
Joseph Rosen, Ben-Gurion University, Israel
José Luís Santos, Universidade do Porto, Portugal
Colin J. R. Sheppard, National University of Singapore, Singapore
Kiyoshi Shimamura, National Institute for Materials Science, Japan
Jagdish P. Singh, Mississippi State University, USA
Yinglin Song, Harbin Institute of Technology, China
Theo Tschudi, Darmstadt University of Technology, Germany
Leonid P. Yaroslavsky, Tel Aviv University, Israel
Jianping Yin, East China Normal University, China
Yong Zhao, Northeastern University, China