Editorial Board

• Mustafa A. G. Abushagur, Rochester Institute of Technology, USA
• Partha P. Banerjee, University of Dayton, USA
• Ralph Barry Johnson, Alabama A&M University , USA
• Augusto Belendez, Universidad de Alicante, Spain
• Steve Blair, University of Utah, USA
• Maria Luisa Calvo, Complutense University of Madrid, Spain
• H. John Caulfield, Fisk University and Alabama A&M University Research Institute, USA
• Pierre Chavel, Institut d Optique, Universite Paris-Sud and CNRS, France
• Zhongping Chen, University of California, USA
• Fu-Pen Chiang, Stony Brook University, USA
• Petr Eliseev, The University of New Mexico, USA
• Michael A. Fiddy, University of North Carolina, USA
• Patti Gillespie, Army Research Laboratory, USA
• Richard B. Hoover, NASA, USA
• Zoran Ikonic, The University of Leeds, United Kingdom
• Saulius Juodkazis, Centre for Micro-Photonics, Australia
• Mark A. Kahan, Optical Research Associates, USA
• Alexander A. Kaminskii, Russian Academy of Science, Russia
• Qiang Lin, Zhejiang University, China
• Liren Liu, Chinese Academy of Sciences, China
• Qingming Luo, Huazhong University of Science and Technology, China
• Daniel Malacara, CIO.Centro de Investigaciones en Óptica, Mexico
• Mikhail Noginov, Norfolk State University, USA
• Ci-Ling Pan, National Tsing Hua University, Taiwan
• Markus Pessa, Tampere University of Technology, Finland
• Giancarlo C. Righini, National Research Council, Italy
• Joseph Rosen, Ben-Gurion University, Israel
• José Luís Santos, Universidade do Porto, Portugal
• Colin J. R. Sheppard, National University of Singapore, Singapore
• Kiyoshi Shimamura, National Institute for Materials Science, Japan
• Jagdish P. Singh, Mississippi State University, USA
• Yinglin Song, Harbin Institute of Technology, China
• Theo Tschudi, Darmstadt University of Technology, Germany
• Leonid P. Yaroslavsky, Tel Aviv University, Israel
• Jianping Yin, East China Normal University, China
• Yong Zhao, Northeastern University, China