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ElectroComponent Science and Technology
Volume 4 (1977), Issue 3-4, Pages 193-203
http://dx.doi.org/10.1155/APEC.4.193

Factors Affecting Laser-Trim Stability of Thick Film Resistors

1E. I. du Pont de Nemours & Co., Inc., Photo Products Department, Electronic Materials Division, Niagara Falls, New York, USA
2E. I. du Pont de Nemours & Co. Inc., Engineering Department, Wilmington, Delaware, USA
3Teradyne lncorporated, Chicago, Illinois, USA

Received 14 June 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Various factors affecting precision of trim and resistor stability are considered. The influence of machine operating parameters (beam power, pulse frequency and trim speed) on resistor performance are examined and quantified through statistically designed experiments for a Q-switched YAG laser system. Laser kerf quality is examined by scanning electron microscopy and related to kerf isolation resistance measurements. A relatively simple, production oriented, quality control test is proposed for rapid determination of kerf electrical stability. In addition, the effect of cut design and extent of trim on precision and stability are discussed.