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ElectroComponent Science and Technology
Volume 4 (1977), Issue 2, Pages 85-88
http://dx.doi.org/10.1155/APEC.4.85

Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M.

Plessey Company Limited, Northants, Caswell, UK

Received 30 May 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

D. J. Pedder, “Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M.,” ElectroComponent Science and Technology, vol. 4, no. 2, pp. 85-88, 1977. doi:10.1155/APEC.4.85