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ElectroComponent Science and Technology
Volume 8 (1981), Issue 3-4, Pages 175-180
http://dx.doi.org/10.1155/APEC.8.175

Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors

1Kita-Itami Works, Mitsubishi Electric Corporation, ltami 664, Japan
2Central Research Laboratory, Mitsubishi Electric Corporation, Amagasaki 661, Japan
3Manufacturing Development Laboratory, Mitsubishi Electric Corporation, Amagasaki 661, Japan

Copyright © 1981 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Hirofumi Ikeo, Sanpei Sakamoto, Ken Sato, Hisakazu Nishiura, and Katsuhiro Ohno, “Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors,” ElectroComponent Science and Technology, vol. 8, no. 3-4, pp. 175-180, 1981. doi:10.1155/APEC.8.175