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ElectroComponent Science and Technology
Volume 8 (1981), Issue 3-4, Pages 167-174
http://dx.doi.org/10.1155/APEC.8.167

Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index

Production Engineering Research Laboratory, Hitachi Ltd., Totsuka-ku, Yokohama 244, Japan

Copyright © 1981 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Susumu Kasukabe and Minoru Tanaka, “Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index,” ElectroComponent Science and Technology, vol. 8, no. 3-4, pp. 167-174, 1981. doi:10.1155/APEC.8.167