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ElectroComponent Science and Technology
Volume 9 (1982), Issue 4, Pages 239-242

Reliability of LED's; Are the Accelerated Ageing Tests Reliable?

Research Institute for Technical Physics of the HAS, Ujpest 1, P.O. Box 76, Budapest 1325, Hungary

Received 16 April 1981; Accepted 20 October 1981

Copyright © 1982 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The mechanisms, leading to light output degradation of LED's were studied using a number of different techniques e.g. deep level spectroscopy, electroluminescence, minority carrier life time measurements. Several processes were revealed having different temperature and stress current dependence. Using these data extrapolations based on accelerated ageing test results are reexamined.