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 Treated III-V Semiconductors

<table>Oxide trap density and mobile ion density of TiO<sub>2</sub>/S-InP MOS structures as a function of PMA temperature.</table>

Active and Passive Electronic Components

fig11

Figure 11

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 Treated III-V Semiconductors 

Figure 11 | Comprehension of Postmetallization Annealed MOCVD-
	
		
			

			

		
	
 on 
	
		
			

			

			

			

			

		
	

 Treated III-V Semiconductors 

Active and Passive Electronic Components

Comprehension of Postmetallization Annealed MOCVD- on Treated III-V Semiconductors

Figure 11