| | MOS structures | Dielectric constant | Leakage current at 1 MV/cm | Interface state density | of hysteresis loop |
| | PMA(350°C)-TiO2/S-InP | 44 | 2.7 × 10−7 and 2.3 × 10−7 A/cm2 | 7.13 × 1011 cm−2 eV−1 | 17 mV | | PMA(350°C)-TiO2/S-GaAs | 66 | 9.7 × 10−8 and 1.4 × 10−7 | 5.96 × 1011 cm−2 eV−1 | 9 mV |
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