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Active and Passive Electronic Components
Volume 2012 (2012), Article ID 276145, 7 pages
http://dx.doi.org/10.1155/2012/276145
Research Article

Modeling of Current-Voltage Characteristics of the Photoactivated Device Based on SOI Technology

Faculty of Engineering, Bar Ilan University, 52900 Ramat Gan, Israel

Received 31 July 2011; Revised 14 November 2011; Accepted 1 December 2011

Academic Editor: Abdelkarim Mercha

Copyright © 2012 Doron Abraham et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Doron Abraham, Avraham Chelly, David Elbaz, Shimron Schiff, Michah Nabozny, and Zeev Zalevsky, “Modeling of Current-Voltage Characteristics of the Photoactivated Device Based on SOI Technology,” Active and Passive Electronic Components, vol. 2012, Article ID 276145, 7 pages, 2012. doi:10.1155/2012/276145