Research Article
Effects of Annealing Time on the Performance of OTFT on Glass with ZrO2 as Gate Dielectric
Table 1
Device parameters of the OTFTs.
| | 0 min | 5 min | 15 min | 40 min | 60 min |
| (×10−3 cm2/Vs) | 1.19 | 1.21 | 1.23 | 1.31 | 1.43 | (V/decade) | 1.53 | 1.45 | 1.11 | 1.03 | 0.8 | (nA) | 2.59 | 1.73 | 1.39 | 0.76 | 0.73 | (×1013 cm−2) | 6.89 | 6.51 | 4.92 | 4.54 | 3.47 |
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