Journals
Publish with us
Publishing partnerships
About us
Blog
Active and Passive Electronic Components
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Active and Passive Electronic Components
/
2013
/
Article
/
Fig 10
/
Research Article
Logic Gates and Ring Oscillators Based on Ambipolar Nanocrystalline-Silicon TFTs
Figure 10
Effect of bias stress degradation on frequency of oscillation of a three-stage ring oscillator at various supply voltages.