Research Article

A Novel Nanoscale FDSOI MOSFET with Block-Oxide

Figure 5

Simulated DIBL as a function of the gate length for a low drain bias (  V) and high drain bias (  V). It is shown that the DIBL characteristics of the bFDSOI-FETs are better than those of the FDSOI-FET and similar to those of the UTBSOI-FET.
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