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The First European Hybrid Microelectronics Conference. Part II
- Editorial, Frau C. Buck
Volume 4 (1977), Issue 3-4, Pages 115-115 - Improved Hybrid Circuit Assembly Yields and Reliability by
Glassivation of the Semiconductor Chip, B. C. Heap and S. A. France
Volume 4 (1977), Issue 3-4, Pages 117-124 - Characterization of Thick Film Capicitors, Y. Leroy, M. Descamps, and M. Vernet
Volume 4 (1977), Issue 3-4, Pages 125-131 - Reactive Sputtering of NiCr Resistors With Closely Adjustable
Temperature Coefficient of Resistance, Jürgen Griessing
Volume 4 (1977), Issue 3-4, Pages 133-137 - Thin Film Integrated RC-Networks With Compensated Temperature
Coefficients of R and C, H. W. Pötzlberger
Volume 4 (1977), Issue 3-4, Pages 139-142 - Optimisation of Thin and Thick Film Technology for Hybrid Microwave
Circuits, Holger Meinel, Bernhard Rembold, and Werner Wiesbeck
Volume 4 (1977), Issue 3-4, Pages 143-146 - Adhesion Measurements of Metallizations for Hybrid Microcircuits, H. G. Kadereit and A. Schlemm
Volume 4 (1977), Issue 3-4, Pages 147-150 - CALHYM: A Computer Program for the Automatic Layout of Large Digital
Hybrid Microcircuits, H. Beke, S. Mazur, R. Govaerts, W. Sansen, and R. Van Overstraeten
Volume 4 (1977), Issue 3-4, Pages 151-156 - Remarks on Wire and Die Bonding for Hybrid Circuits, A. Soffa
Volume 4 (1977), Issue 3-4, Pages 157-161 - A New Concept in Calculation of Thick Film Resistors, G. Stecher
Volume 4 (1977), Issue 3-4, Pages 163-169 - Criteria of Low-Noise Thick-Film Resistors, L. K. J. Vandamme
Volume 4 (1977), Issue 3-4, Pages 171-177 - Comparison of Arc Erosive and Laser Beam Trimming of Thin Film
Resistors, Zs. Illyefalvi-Vitéz
Volume 4 (1977), Issue 3-4, Pages 179-183 - A High Speed ECL Multiplexer in Beam Lead, Hybrid Technology, J. B. Coughlin, J. B. Hughes, R. S. Watts, and F. W. Siegert
Volume 4 (1977), Issue 3-4, Pages 185-191 - Factors Affecting Laser-Trim Stability of Thick Film Resistors, R. E. Cote, R. C. Headley, J. T. Herman, and A. Howe
Volume 4 (1977), Issue 3-4, Pages 193-203 - Influence of the Metal Migration From Screen-and-Fired Terminations
on the Electrical Characteristics of Thick-Film Resistors, A. Cattaneo, M. Cocito, F. Forlani, and M. Prudenziati
Volume 4 (1977), Issue 3-4, Pages 205-211 - The Reliability, Testing and Evaluation of Hybrid Microcircuits, A. H. George
Volume 4 (1977), Issue 3-4, Pages 213-217 - Economics of Thick and Thin Film Hybrid Production in Europe, D. Boswell and D. S. Campbell
Volume 4 (1977), Issue 3-4, Pages 219-223 - Book Review, P. L. Moran
Volume 4 (1977), Issue 3-4, Pages 225-225 - Conference News
Volume 4 (1977), Issue 3-4, Pages 226-226 - Announcements
Volume 4 (1977), Issue 3-4, Pages 227-227 - Erratum
Volume 4 (1977), Issue 3-4, Pages 228-228