Volume 12 [30 articles]

• Editorial, Joseph A. Castellano and David S. Campbell
  Volume 12 (1985), Issue 1, Pages 1-1
• Improved Rational Two-Port Model of Uniform R-C-NR Structure, Umesh Kumar and Somesh Jha
  Volume 12 (1985), Issue 1, Pages 3-7
• Thin Metal Film Sensors, C. R. Tellier
  Volume 12 (1985), Issue 1, Pages 9-32
• The Influence of Lubrication on Electrical and Mechanical Parameters of Potentiometer Resistive Element, S. Nowak and B. Herod
  Volume 12 (1985), Issue 1, Pages 33-40
• Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors, Maria Prudenziati, Bruno Morten, and Maria Franca Brigatti
  Volume 12 (1985), Issue 1, Pages 41-57
• Comment on the Dependence of R_□ and Current Noise on Grain Size in Thick Film Resistors (TFR's), M. Wolf, F. Müller, and H. Hemschik
  Volume 12 (1985), Issue 1, Pages 59-61
• Voltage Degradation Model of Thin Film Capacitors, T. M. Berlicki
  Volume 12 (1985), Issue 1, Pages 63-70
• On Possibilities of Synthesis of a Useful Model of Thick Film Components, Stanisław Paszczyński
  Volume 12 (1985), Issue 1, Pages 71-89
• Thick Film Temperature Sensors Using Standard Pastes, I. Janoska and M. R. Haskard
  Volume 12 (1986), Issue 2, Pages 91-101
• Electrical Conductivity of Thin Wires, R. Dimmich and F. Warkusz
  Volume 12 (1986), Issue 2, Pages 103-109