Volume 12 [30 articles]
All | 1-10 | 11-20 | 21-30
- Book Reviews
Volume 12 (1987), Issue 3, Pages 213-214 - Low Frequency Noise in Tantalum Capacitors, D. T. Smith
Volume 12 (1987), Issue 4, Pages 215-221 - The Growth and Assessment of GaAs Epitaxial Layers Obtained From
Ga-As-Bi Solutions, J. Kozlowski, M. Panek, M. Ratuszek, and M. Tlaczala
Volume 12 (1987), Issue 4, Pages 223-229 - Stability and Performance Characterization of Thick Film
Microresistors, Shobha C. Ravi
Volume 12 (1987), Issue 4, Pages 231-237 - Modelling Thermal Resistance of Power Modules Having Solder Voids
With Finite Elements, R. A. Tatara
Volume 12 (1987), Issue 4, Pages 239-250 - The Relationship Between the Electrical Properties of Thick Film
Resistors and the Thermal Expansion Coefficient of the Substrates, Toshio Inokuma, Yoshiaki Taketa, and Miyoshi Haradome
Volume 12 (1987), Issue 4, Pages 251-257 - Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper), J. Møltoft
Volume 12 (1987), Issue 4, Pages 259-279 - Low Temperature Firing of Pb-Contained Thick Film Dielectrics, Shen-Li Fu and Gung-Fun Chen
Volume 12 (1987), Issue 4, Pages 281-290 - Feasibility of Using Oscillatory Catalytic Oxidation Phenomenon for Selective Carbon Monoxide Sensing, Heikki Torvela
Volume 12 (1987), Issue 4, Pages 291-301 - Errata
Volume 12 (1987), Issue 4, Pages 303-303