Volume 22 [20 articles]

• Synthesis of Hybrid Electrochromic Material Based on Tungsten Oxide, B. W. Kim, J. Portier, N. G. Park, and G. Campet
  Volume 22 (1999), Issue 2, Pages 133-146
• Relaxable Damage in Hot-Carrier Stressing of n-Mos Transistors , M. Rahmoun, E. Bendada, A. El Hassani, and K. Raïs
  Volume 22 (2000), Issue 3, Pages 147-156
• A New Method for the Extraction of Diode Parameters Using a Single Exponential Model, S. Dib, M. De La Bardonnie, A. Khoury, F. Pelanchon, and P. Mialhe
  Volume 22 (2000), Issue 3, Pages 157-163
• Peltier Effect Applied to the Design and Realization of a New Mass Flow Sensor, M. Rahmoun, A. El Hassani, D. Leclerq, and E. Bendada
  Volume 22 (2000), Issue 3, Pages 165-174
• Evaluation of Meshed Reference Planes for High Performance Applications, N. D. Codreanu, P. Svasta, V. Golumbeanu, and L. Gál
  Volume 22 (2000), Issue 3, Pages 175-187
• Computer-Aided Numerical Inversion Of Laplace Transform, Umesh Kumar
  Volume 22 (2000), Issue 3, Pages 189-213
• A New Statistical Method for Maximum Power Estimation in CMOS VLSI Circuits, N. E. Evmorfopoulos and J. N. Avaritsiotis
  Volume 22 (2000), Issue 3, Pages 215-233
• Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures, Muhammad Taher Abuelma'atti and Isa Salman Qamber
  Volume 22 (2000), Issue 4, Pages 235-255
• The Li and Co-Substituted Spinel Mn Oxide, (Li)8a[Lix/4Co3x/4Mn2−x]16dO4, and its Use as Cathode Material in Flat and Flexible Lithium Battery, Y. S. Hong, C. H. Han, K. Kim, C. W. Kwon, and G. Campet
  Volume 22 (2000), Issue 4, Pages 257-263
• Degradation of VDMOSFET by Heavy Ion Irradiations, C. Salame, F. Pelanchon, and P. Mialhe
  Volume 22 (2000), Issue 4, Pages 265-282