Volume 22 [20 articles]

• Three-Dimensional Modelling and Simulation Theory of Field Effect Devices, M. N. Doja, Moinuddin, and Umesh Kumar
  Volume 22 (1999), Issue 1, Pages 1-15
• Fuzzy Logic Transformer Design Algorithm (FLTDA), R. R. Mudholkar, S. R. Sawant, G. G. Tengshe, and A. B. Bagwan
  Volume 22 (1999), Issue 1, Pages 17-29
• Reliability and Availability Analysis of Some Systems With Common-Cause Failures Using Spice Circuit Simulation Program , Muhammad Taher Abuelma'atti and Isa Salman Qamber
  Volume 22 (1999), Issue 1, Pages 31-49
• High Speed Non-Linear Circuit Simulation of Bipolar Junction Transistors, M. N. Doja, Moinuddin, and Umesh Kumar
  Volume 22 (1999), Issue 1, Pages 51-73
• Trigonometric Approximations for Some Bessel Functions, Muhammad Taher Abuelma'atti
  Volume 22 (1999), Issue 2, Pages 75-85
• PLR (Plastic Lithium Rechargeable) Batteries Using Nanoscale Materials: A Convenient Electrical Energy Power for the Future?, G. Campet, N. Treuil, A. Poquet, S. Y. Hwang, C. Labrugere, A. Deshayes, J. C. Frison, J. Portier, J. M. Reau, and J. H. Choy
  Volume 22 (1999), Issue 2, Pages 87-105
• Pseudo-Period of Distorted Lattices in Disordered Solids, M. A. Grado-Caffaro and M. Grado-Caffaro
  Volume 22 (1999), Issue 2, Pages 107-109
• A Method for the Statistical Evaluation of Crosstalk Effect Between Three Parallel Conductors, P. T. Trakadas and C. N. Capsalis
  Volume 22 (1999), Issue 2, Pages 111-119
• Measurement of Self-Heating Affected Dynamic Error of Precision Wire-Wound Resistors, Zsolt Szepessy
  Volume 22 (1999), Issue 2, Pages 121-128
• On the Sensitivity of the Tunneling Current to Electric Field in a MOSFET with Two Gates, M. A. Grado-Caffaro and M. Grado-Caffaro
  Volume 22 (1999), Issue 2, Pages 129-131
• Synthesis of Hybrid Electrochromic Material Based on Tungsten Oxide, B. W. Kim, J. Portier, N. G. Park, and G. Campet
  Volume 22 (1999), Issue 2, Pages 133-146
• Relaxable Damage in Hot-Carrier Stressing of n-Mos Transistors , M. Rahmoun, E. Bendada, A. El Hassani, and K. Raïs
  Volume 22 (2000), Issue 3, Pages 147-156
• A New Method for the Extraction of Diode Parameters Using a Single Exponential Model, S. Dib, M. De La Bardonnie, A. Khoury, F. Pelanchon, and P. Mialhe
  Volume 22 (2000), Issue 3, Pages 157-163
• Peltier Effect Applied to the Design and Realization of a New Mass Flow Sensor, M. Rahmoun, A. El Hassani, D. Leclerq, and E. Bendada
  Volume 22 (2000), Issue 3, Pages 165-174
• Evaluation of Meshed Reference Planes for High Performance Applications, N. D. Codreanu, P. Svasta, V. Golumbeanu, and L. Gál
  Volume 22 (2000), Issue 3, Pages 175-187
• Computer-Aided Numerical Inversion Of Laplace Transform, Umesh Kumar
  Volume 22 (2000), Issue 3, Pages 189-213
• A New Statistical Method for Maximum Power Estimation in CMOS VLSI Circuits, N. E. Evmorfopoulos and J. N. Avaritsiotis
  Volume 22 (2000), Issue 3, Pages 215-233
• Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures, Muhammad Taher Abuelma'atti and Isa Salman Qamber
  Volume 22 (2000), Issue 4, Pages 235-255
• The Li and Co-Substituted Spinel Mn Oxide, (Li)8a[Lix/4Co3x/4Mn2−x]16dO4, and its Use as Cathode Material in Flat and Flexible Lithium Battery, Y. S. Hong, C. H. Han, K. Kim, C. W. Kwon, and G. Campet
  Volume 22 (2000), Issue 4, Pages 257-263
• Degradation of VDMOSFET by Heavy Ion Irradiations, C. Salame, F. Pelanchon, and P. Mialhe
  Volume 22 (2000), Issue 4, Pages 265-282