Film Thickness Analysis for EHL Contacts under Steady-State and Transient Conditions by Automatic Digital Image Processing

<table>Film thickness profiles along the <i>y</i>- (top) and <i>x</i>-directions (bottom) (perpendicular to the entraining direction and entraining direction, resp.) under steady-state conditions for S = −1.8, S = 0, and S = +1.8.</table>

Advances in Tribology

fig13

Figure 13

Figure 13: Film Thickness Analysis for EHL Contacts under Steady-State and Transient Conditions by Automatic Digital Image Processing 