Individual IOL Surface Topography Analysis by the WaveMaster Reflex UV

Table 5

Residual analysis for higher-order surfaces.

Sample	Measurement		Design		Difference
	RMS/µm	P2V/µm	RMS/µm	P2V/µm	RMS/nm	P2V/nm
Ho 1	0.114	0.533	0.034	0.263	80	270
Ho 2	0.251	1.353	0.143	1.125	108	228
Ho 3	0.333	2.279	0.255	1.938	78	341
Ho 4	0.166	0.883	0.046	0.306	120	577
Ho 5	0.151	0.943	0.096	0.641	55	302
Ho 6	0.263	1.617	0.124	0.845	139	772
				Average	0.097	0.415
				SDV	0.099	0.439