Research Article
Individual IOL Surface Topography Analysis by the WaveMaster Reflex UV
Table 5
Residual analysis for higher-order surfaces.
| Sample | Measurement | Design | Difference | RMS/µm | P2V/µm | RMS/µm | P2V/µm | RMS/nm | P2V/nm |
| Ho 1 | 0.114 | 0.533 | 0.034 | 0.263 | 80 | 270 | Ho 2 | 0.251 | 1.353 | 0.143 | 1.125 | 108 | 228 | Ho 3 | 0.333 | 2.279 | 0.255 | 1.938 | 78 | 341 | Ho 4 | 0.166 | 0.883 | 0.046 | 0.306 | 120 | 577 | Ho 5 | 0.151 | 0.943 | 0.096 | 0.641 | 55 | 302 | Ho 6 | 0.263 | 1.617 | 0.124 | 0.845 | 139 | 772 |
| | | | | Average | 0.097 | 0.415 | | | | | SDV | 0.099 | 0.439 |
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