Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

Figure 7

(a) Misclassification rates of ELM-based algorithm with different mapping functions for circuit in Figure 6(a), when the number of impulse-response samples is 30. (b) Misclassification rates of ELM-based algorithm with different mapping functions for circuit in Figure 6(a), when the number of impulse-response samples is 5.

(a)

(b)