Research Article
Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
Figure 8
(a) Misclassification rates of SVM- and ELM-based algorithms for circuits in Figures 6(a), 6(b), and 6(c), when the number of impulse-response samples is 30. (b) Time cost of SVM- and ELM-based algorithms for circuits in Figures 6(a), 6(b), and 6(c), when the number of impulse-response samples is 30.
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