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International Journal of Agronomy
Volume 2013 (2013), Article ID 201851, 9 pages
http://dx.doi.org/10.1155/2013/201851
Research Article

Line × Tester Mating Design Analysis for Grain Yield and Yield Related Traits in Bread Wheat (Triticum aestivum L.)

1National Institute of Agricultural Research, Setif Agricultural Research Unit, Setif 19000, Algeria
2Faculty of Life and Natural Sciences, Ecology and Plant Biology Department, University of Ferhat Abbas, Setif 1 19000, Algeria
3Faculty of Agro-Veterinary and Biological Sciences, Agronomy Department, University of Saad Dahlab, Blida 09000, Algeria

Received 6 March 2013; Revised 20 May 2013; Accepted 29 May 2013

Academic Editor: David Clay

Copyright © 2013 Zine El Abidine Fellahi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Zine El Abidine Fellahi, Abderrahmane Hannachi, Hamenna Bouzerzour, and Ammar Boutekrabt, “Line × Tester Mating Design Analysis for Grain Yield and Yield Related Traits in Bread Wheat (Triticum aestivum L.),” International Journal of Agronomy, vol. 2013, Article ID 201851, 9 pages, 2013. doi:10.1155/2013/201851