Research Article
Line × Tester Mating Design Analysis for Grain Yield and Yield Related Traits in Bread Wheat (Triticum aestivum L.)
Table 2
Analysis of variance for combining ability effects of different bread wheat characters.
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DHE: number of days to heading, PHT: plant height (cm), SL: spike length (cm), FT: number of fertile tillers, TKW: thousand-kernel weight (g), NG: number of grains per spike, GY: grain yield (g), ns, * and **: non-significant and significant effect at 0.05 and 0.01 probability, P: parents, C: crosses, L: lines, and T: testers. |