Research Article

Line × Tester Mating Design Analysis for Grain Yield and Yield Related Traits in Bread Wheat (Triticum aestivum L.)

Table 2

Analysis of variance for combining ability effects of different bread wheat characters.

SourcedfDHEPHT SLFTTKWNGGY

Rep25.754.10.3131252.362
Gen2815.6*226.8*2.9*23.4*33.2**152.8**39.7*
Par (P)826.4*348.0*2.6*29.9*63.1**279.1**42.7*
Crosses (C)1910.7*171.8*2.5*19.6*22.3**107.6**33.8*
P versus C121.4*301.4*11.9*44.5*0.9ns2.3ns129.0*
Lines (L)421.2*89.0*3.3*28.1*26.8**120.5*65.5*
Testers (L)339.5*751.2*2.5*37.2*91.1**357.7**25.8*
L versus T17.6ns174.7*0.3ns15.1*45.3*267.6*2.2ns
L × T124.2ns46.8*1.9*10.0*3.6ns40.8*25.6*
Error562.524.10.73.4611.16.5

DHE: number of days to heading, PHT: plant height (cm), SL: spike length (cm), FT: number of fertile tillers, TKW: thousand-kernel weight (g), NG: number of grains per spike, GY: grain yield (g), ns, * and **: non-significant and significant effect at 0.05 and 0.01 probability, P: parents, C: crosses, L: lines, and T: testers.