Far-Field Testing Method of Spurious Emission Produced by HF RFID

<table class="figure-group"><tr class="fig-image" id="a"><td><object data="https://static.hindawi.com/articles/ijap/volume-2016/4715898/figures/4715898.fig.006a.svgz" name="4715898.fig.006a" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(a) </b>Proposed reference chip model</td></tr><tr class="fig-image" id="b"><td><object data="https://static.hindawi.com/articles/ijap/volume-2016/4715898/figures/4715898.fig.006b.svgz" name="4715898.fig.006b" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(b) </b>Simplified harmonic model of a chip</td></tr></table>

<div>Proposed reference model and simplified harmonic model of a chip.</div>

International Journal of Antennas and Propagation

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Figure 6

Figure 6: Far-Field Testing Method of Spurious Emission Produced by HF RFID 