Research Article

Process to Improve the Adherences of Copper to a PTFE Plate

Table 1

Process conditions at the RIE for Cu adherence to the polished Teflon.

Pressure (mTorrs)Power (watts)Flow (SCCM)

3025030
1025030
5 25030
3025020
1025020
5 25020
3025010
1025010
5 25010
3015030
1015030
5 15030
3015020
1015020
5 15020
3015010
1015010
5 15010
3010030
1010030
5 10030
3010020
1010020
5 10020
3010010
1010010
5 10010

SCCM is standard cubic centimeters per minute, a flow measurement term indicating cm3/min at a standard temperature and pressure.