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International Journal of Microwave Science and Technology
Volume 2012 (2012), Article ID 865625, 4 pages
http://dx.doi.org/10.1155/2012/865625
Research Article

Invariance Property of the 𝜇 Stability Test with respect to the Characteristic Impedance

1Electronics Engineering Department, American University in Cairo, Cairo, Egypt
2Army Research Laboratory, Adelphi, MD 20783, USA

Received 21 December 2011; Revised 18 February 2012; Accepted 20 February 2012

Academic Editor: Chien-Jen Wang

Copyright © 2012 Amr A. Ibrahim et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Amr A. Ibrahim, Ali M. Darwish, and H. Alfred Hung, “Invariance Property of the Stability Test with respect to the Characteristic Impedance,” International Journal of Microwave Science and Technology, vol. 2012, Article ID 865625, 4 pages, 2012. doi:10.1155/2012/865625