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International Journal of Microwave Science and Technology
Volume 2012 (2012), Article ID 865625, 4 pages
Invariance Property of the Stability Test with respect to the Characteristic Impedance
1Electronics Engineering Department, American University in Cairo, Cairo, Egypt
2Army Research Laboratory, Adelphi, MD 20783, USA
Received 21 December 2011; Revised 18 February 2012; Accepted 20 February 2012
Academic Editor: Chien-Jen Wang
Copyright © 2012 Amr A. Ibrahim et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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