Parametric Conversion in Micrometer and Submicrometer Structured Ferroelectric Crystals by Surface Poling
Figure 1
(a) Micrograph of an SPP-LT sample after chemical etching; a nonuniform mark-to-space ratio is visible in the poled area with 2-μm period. (b) Fourier spectrum of the nonlinear distribution shown in (a).
