Parametric Conversion in Micrometer and Submicrometer Structured Ferroelectric Crystals by Surface Poling

Figure 5

(a) Channel waveguide in a PPLN/PPLT sample. (b) Sealed ampoule technique. (c) Extraordinary index profile calculated by inverse WKB from distributed coupling data; dots are measured effective indices at 632.8 nm, and the solid line is a WKB fit.