Research Article

Preparation and Characterization of (Au/n-Sn /Si /Si/Al) MIS Device for Optoelectronic Application

Figure 9

The spectral responsivity as a function of the incident wavelength. (a) (n-SnO2/n-Si) device, (b) (n- SnO2/p-Si) MIS device.
756402.fig.009a
(a)
756402.fig.009b
(b)