Research Article
Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film
Table 2
The sheet resistance and surface atomic concentration calculation results.
| | Sample description | Sheet resistance, | Surface atomic concentration, % | | Cu 2p | O 1s | C 1s | S 2p |
| | Pure PA | — | — | 15.8 | 84.2 | — | | Sulf. 4hours PA | — | — | 18.1 | 80.6 | 1.3 | | Sulf. 4hours PA (30s) | — | — | 7.7 | 91.2 | 1.1 | | Sulf. 4hours PA Cu(I) | 6300 | 1.6 | 12.8 | 83.5 | 2.2 | | Sulf. 4hours PA Cu(I) (30s) | 5.0 | 10.2 | 80.8 | 3.9 | | Sulf. 5hours PA Cu(I) | 102 | 2.1 | 31.5 | 62.8 | 3.6 | | Sulf. 5hours PA Cu(I) (30s) | 19.7 | 22.7 | 43.2 | 14.4 |
|
|
