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International Journal of Photoenergy
Volume 2012 (2012), Article ID 357218, 5 pages
Investigation of the Relationship between Reverse Current of Crystalline Silicon Solar Cells and Conduction of Bypass Diode
Institute of Solar Energy MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Department of Physics, Xi’an Jiaotong University, Xi’an 710049, China
Received 9 December 2011; Accepted 31 January 2012
Academic Editor: Bhushan Sopori
Copyright © 2012 Hong Yang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
- P. Spirito and V. Abergamo, “Reverse bias power dissipation of shadowed or faulty cells in different array configurations,” in Proceedings of the 4th European Photovoltaic Solar Energy Conference, pp. 296–300, 1982.
- J. Wohlgemuth and W. Herrmann, “Reliability testing for PV modules,” in Proceedings of the 26th IEEE Photovoltaic Specialists Conference (PVSC '82), pp. 889–892, 1982.
- W. Herrmann, W. Wiesner, and W. Vaassen, “Hot spot investigations on PV modules—new concepts for a test standard and consequences for module design with respect to bypass diodes,” in Proceedings of the 26th IEEE Photovoltaic Specialists Conference, pp. 1129–1132, Anaheim, Calif, USA, October 1997.
- International Standard IEC-61215:2005, “Crystalline silicon terrestrial photovoltaic (PV) modules design qualification and type approval”.
- M. C. Alonso-García and J. M. Ruíz, “Analysis and modelling the reverse characteristic of photovoltaic cells,” Solar Energy Materials and Solar Cells, vol. 90, no. 7-8, pp. 1105–1120, 2006.
- M. C. Alonso-García, W. Herrmann, W. Böhmer, and B. Proisy, “Thermal and electrical effects caused by outdoor hot-spot testing in associations of photovoltaic cells,” Progress in Photovoltaics: Research and Applications, vol. 11, no. 5, pp. 293–307, 2003.
- M. Simon and E. L. Meyer, “Detection and analysis of hot-spot formation in solar cells,” Solar Energy Materials and Solar Cells, vol. 94, no. 2, pp. 106–113, 2010.
- M. Danner and K. Buecher, “Reverse characteristics of commercial silicon solar cells - impact on hot spot temperatures and module integrity,” in Proceedings of the 26th IEEE Photovoltaic Specialists Conference, pp. 1137–1140, Anaheim, Calif, USA, October 1997.
- O. Breitenstein, J. P. Rakotoniaina, M. H. Al Rifai, and M. Werner, “Shunt types in crystalline silicon solar cells,” Progress in Photovoltaics: Research and Applications, vol. 12, no. 7, pp. 529–538, 2004.
- H. Yang, W. Xu, H. Wang, and M. Narayanan, “Investigation of reverse current for crystalline silicon solar cells-new concept for a test standard about the reverse current,” in 35th IEEE Photovoltaic Specialists Conference (PVSC '10), pp. 2806–2810, June 2010.