Modelling of Light Trapping in Acidic-Textured Multicrystalline Silicon Wafers

Figure 10

Simulated and measured WAR values for short-wavelength region (550 nm to 600 nm) and long-wavelength region (1150 nm to1200 nm) graphed as a function of ℎ/𝐷. The black solid line and (◆) values represent the simulated and measured values for the short wavelength region and the red solid line and (red triangle) symbols represent the simulated and measured values for the long-wavelength region.