Modelling of Light Trapping in Acidic-Textured Multicrystalline Silicon Wafers

<table>Reflection predicted by the model as a function of wavelength and surface morphology indictor <svg height="15" id="M71" style="vertical-align:-2.22495pt" version="1.1" viewbox="0 0 29.549999 15" width="29.549999" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,12.162)"><use xlink:href="#x210E"></use></g><g transform="matrix(.017,-0,0,-.017,8.834,12.162)"><use xlink:href="#x2F"></use></g><g transform="matrix(.017,-0,0,-.017,15.837,12.162)"><use xlink:href="#x1D437"></use></g>
</svg>. The wafer thickness used in the simulations was 200 <i>μ</i>m.</table>

International Journal of Photoenergy

fig6

Figure 6

Figure 6: Modelling of Light Trapping in Acidic-Textured Multicrystalline Silicon Wafers 