Modelling of Light Trapping in Acidic-Textured Multicrystalline Silicon Wafers
Figure 8
Simulated and measured reflection values graphed as a function of wavelength for two samples with different values. Reflection values for are shown in red with the solid line and (red triangle) symbols denoting the simulated and measured values, respectively. Reflection values for are shown in black with the solid line and () symbols denoting the simulated and measured values, respectively.
