Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="4"><hr/></td></tr><tr class="thead"><td align="left">PASL Sample</td><td align="center">Anodisation current <svg height="15.4" id="M30" style="vertical-align:-3.39066pt" version="1.1" viewbox="0 0 14.2 15.4" width="14.2" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,11.112)"><use xlink:href="#x1D43C"></use></g>
<g transform="matrix(.012,-0,0,-.012,7.487,15.187)"><use xlink:href="#x1D44E"></use></g>
</svg> (mA)</td><td align="center"><svg height="18.362499" id="M31" style="vertical-align:-5.76984pt" version="1.1" viewbox="0 0 18.262501 18.362499" width="18.262501" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,11.113)"><path d="M609 650l-19 -162l-30 -2q2 69 -14 94q-9 18 -28.5 26t-74.5 8h-88q-30 0 -37 -6.5t-12 -36.5l-41 -212h103q48 0 69 5.5t32 19t26 50.5h29l-40 -198h-30q2 58 -11.5 70.5t-85.5 12.5h-99l-30 -167q-17 -87 3 -101q18 -15 111 -15q59 0 89 7t54 27q8 7 15.5 16t16 21.5
l14 20.5t15 23.5t13.5 21.5l29 -10q-52 -129 -71 -163h-500l6 28q66 4 83 17.5t28 73.5l77 409q11 61 -0.5 75.5t-78.5 18.5l10 28h467z" id="x1D438"></path></g>
<g transform="matrix(.012,-0,0,-.012,10.8,15.188)"><path d="M546 430q-14 -33 -37.5 -140t-38.5 -209q-29 -195 -156 -289q-29 -21 -70 -37t-78 -16q-62 0 -102.5 37t-40.5 69q0 27 26 48q19 15 25 -3q13 -43 46.5 -69t87.5 -26q55 0 83 21q29 22 50 65t43 140q14 64 29 163h-2q-55 -81 -149 -152q-59 -44 -102 -44q-23 0 -43.5 30
t-20.5 85q0 74 32.5 145.5t84.5 117.5q40 35 100 58.5t117 23.5q21 0 65 -8q30 -6 44 -6zM456 386q-40 16 -81 16q-29 0 -64 -13q-42 -17 -85 -97q-19 -36 -31.5 -86t-12.5 -86q0 -64 30 -64q20 0 52.5 21t60.5 52q74 81 95 123q26 62 36 134z" id="x1D454"></path></g>
</svg> (eV)<br/> PDS</td><td align="center"><svg height="18.362499" id="M32" style="vertical-align:-5.76984pt" version="1.1" viewbox="0 0 18.262501 18.362499" width="18.262501" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,11.113)"><use xlink:href="#x1D438"></use></g>
<g transform="matrix(.012,-0,0,-.012,10.8,15.188)"><use xlink:href="#x1D454"></use></g>
</svg> (eV) <br/>PL</td></tr><tr><td class="thead-hr" colspan="4"><hr/></td></tr><tr><td align="left">A</td><td align="center">200</td><td align="center">2.2</td><td align="center">2.2</td></tr><tr><td align="left">B</td><td align="center">250</td><td align="center">2</td><td align="center">1.99</td></tr><tr><td align="left">C</td><td align="center">300</td><td align="center">2.01</td><td align="center">1.9</td></tr><tr><td align="left">D</td><td align="center">350</td><td align="center">1.95</td><td align="center">1.98</td></tr><tr><td align="left">E</td><td align="center">400</td><td align="center">1.93</td><td align="center">1.97</td></tr><tr class="table-tr"><td colspan="4"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

International Journal of Photoenergy

tab1

Table 1

Table 1: Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD 